JIS Z 0602 PDF

JIS Z Test methods for flat pallets (FOREIGN STANDARD). Available for Subscriptions. Content Provider Japanese Industrial Standards [JIS]. Standard (JIS Z ) was performed. From the obtained results, the possibility of practical application was exam- ined. Moreover, the manufacturing process of. JIS Z – JIS Z Test methods for flat pallets. Publication date: ; Original language: English. Please select.

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That is, it is a non-maintainable component. Values in parentheses indicate the minimum quality required to have 19 out of 20 lots pass on average. As the device is subjected to more and more cycles of intermittent operation nas shown in figure B. A mask defect can be detected at the same level ijs expectation at the inspection area t and at the number of inspection cycles x figure B.

JIS Z 0602:1988

The possible test results are limited to either 1 “failure or defect”or 2 “no failure or acceptance,” with no possibility of such results as “pending decision” or “exception acceptance” allowed. IX Thus understanding the Poisson distribution in different ways we can clarify its relations with other probability distributions.

For the system in figure B.

Such a probability process is known as the Poisson process. Let us assume that a given lot of semiconductor devices are storage tested at temperature Jid.

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If the original population is large, however, the fraction defective obtained through a sampling inspection can be approximated by the binomial distribution. In general, once a semiconductor device has failed, it cannot be repaired and used again. Subsequent lots are, however, subject to normal inspection. Use first sampling plan below arrow. For example, if we say that a given semiconductor device has a failure rate of 10 FIT, this means that one device fails for every component hours.

We can, however, make a generalization about the state function f X and the characteristic value X that defines the state. Math Statistics And Probability A. Different ways are available for sampling n devices from N devices. In chemical reactions, if molecules reach the temperature above which they may react the activation energya reaction occurs.

The Poisson distribution approximates the binomial probability distribution if the population is large and the phenomenon occurs with a low probability.

A.1 AQL Sampling Table

After n times of tests, any one of the results his E1, E2, It becomes the determining factor in the life of the device. As time t passes, the failure rate of these semiconductor devices changes. The values of p and q will be uniform for all test results.

If two-sided probability of distribution is considered, then the above values, respectively, correspond to 2. Expected characteristics of the ijs fNorm x are these: Let us assume that the device will fail when the characteristic value changes to XL. In this case as well, the failures of individual devices are taken to be mutually independent.

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JIS Z – Test methods for flat pallets (FOREIGN STANDARD)

If the operating time between subsequent failures of a device throughout its life until discarded is given by 002, t2, The result Ei occurs with the probability pi. How the lot acceptance rate changes is illustrated by the operation characteristic curve OC curve in figure B.

Each test result is independent from one another. Will not be passed. If the sampled device is returned each time to choose a device from N constantly, or using replacement operations in other words, we will obtain a binomial distribution.

The relationship between activation energy and the acceleration factor is shown in figure B. This probability is expressed as follows using jsi IX for the Poisson distribution.